An IV-SVM-based Approach for Identification of State-Space LPV Models under Generic Noise Conditions

被引:0
|
作者
Rizvi, Syed Z. [1 ]
Mohammadpour, Javad [1 ]
Toth, Roland [2 ]
Meskin, Nader [3 ]
机构
[1] Univ Georgia, Coll Engn, CSCL, Athens, GA 30602 USA
[2] Eindhoven Univ Technol, Dept Elect Engn, Control Syst Grp, POB 513, NL-5600 MB Eindhoven, Netherlands
[3] Qatar Univ, Dept Elect Engn, Doha, Qatar
关键词
SUBSPACE IDENTIFICATION; SYSTEMS;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a nonparametric identification method for state-space linear parameter-varying (LPV) models using a modified support vector machine (SVM) approach. While most LPV identification schemes in the state-pace form fall under the general category of parametric methods, regularization-based SVMs provide a viable alternative to model scheduling dependencies, without the need of specifying the dependency structure and with an attractive bias-variance trade-off. In this paper, a solution is proposed for nonparametric identification of LPV state-space models in terms of least-squares SVMs (LS-SVM) and is then extended in a way that the proposed estimation is robust to errors in the noise model estimation. The so-called instrumental variables (IV) method has been used in linear system identification for quite some time, and has recently seen its application in the identification of both nonlinear and LPV systems in the input-output (IO) form. The IV method reduces the bias in estimated LPV state-space models in case the noise model is not estimated properly or is unknown. In the proposed method of this paper, the attractive bias-variance trade-off properties of LS-SVMs are combined with statistical properties of IV-based methods to give robust estimates of the functional dependencies. Numerical examples are provided to compare the performances of the proposed IV-based technique with the LS-SVM-based LPV model identification methods.
引用
收藏
页码:7380 / 7385
页数:6
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    (1) Complex Systems Control Laboratory (CSCL), College of Engineering, University of Georgia, Athens; GA; 30602, United States; (2) Control Systems Group, Dept. of Electrical Engineering, Eindhoven University of Technology, P.O.Box 513, Eindhoven; 5600 MB, Netherlands; (3) Dept. of Electrical Engineering, Qatar University, Doha, Qatar, 1600, Cybernet Systems; et al.; Kozo Keikaku Engineering (KKE); MathWorks; Mitsubishi Electric; Springer (Institute of Electrical and Electronics Engineers Inc.):
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