Nanoscale infrared spectroscopy of polymeric samples based on atomic force microscopy

被引：0
|
作者：
Prater, Craig [1 ]
Kjoller, Kevin [1 ]
Meyers, Greg [1 ]
Shetty, Roshan [1 ]
机构：
[1] Dow Chem Co USA, Midland, MI 48674 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2010年 / 239卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
200-ANYL
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页数：1
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