Detection of flicker caused by high-frequency interharmonics

被引:0
|
作者
Kim, Taekhyun [1 ]
Wang, Adam [2 ]
Powers, Edward J. [1 ]
Grady, W. Mack [1 ]
Arapostathis, Ari [1 ]
机构
[1] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA
[2] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
关键词
interharmonics; harmonics; flicker; flickermeter peak detection; down-up sampling;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
International standard bodies specified have an instrument capable of detecting and assessing the severity of lighting flicker, which is called a flickermeter However, the recommended flickermeter did not consider flicker caused by high frequency interharmonics. In recent studies, the deficiency of the current flickermeter standard is reported based on real field case examples. In this paper, we review the deficiency of the current flickermeter standard regarding interharmonics, and propose a new approach based on down-up sampling in the discrete time sample domain. We demonstrate the efficacy of the proposed method by qualitative and quantitative comparison with the current flickermeter standard in the presence of interharmonics.
引用
收藏
页码:336 / +
页数:2
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