Current annealing of glass-coated amorphous wire for noise reduction of low-offset fundamental mode orthogonal fluxgate

被引：0
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作者：
Murata, N. [1 ,2 ]
Nomura, R. [1 ]
机构：
[1] Japan Aerosp Explorat Agcy JAXA, Environm Test Technol Unit, Tsukuba, Ibaraki, Japan
[2] Grad Univ Adv Studies, Dept Space & Astronaut Sci, Sagamihara, Kanagawa, Japan
来源：
2018 IEEE INTERNATIONAL MAGNETIC CONFERENCE (INTERMAG) | 2018年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页数：2
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