Influence of the space charge of an ion beam on the time-of-flight diagnostics of its composition

被引:2
|
作者
Pushkarev, A. [1 ,2 ,3 ]
Zhu, X. P. [1 ,2 ]
Zhang, C. C. [1 ,2 ]
Prima, A. [3 ]
Li, Y. [1 ,2 ]
Egorova, Yu. [3 ]
Lei, M. K. [1 ,2 ]
机构
[1] Dalian Univ Technol, Minist Educ, Surface Engn Lab, Sch Mat Sci & Engn, Dalian 116024, Peoples R China
[2] Dalian Univ Technol, Minist Educ, Key Lab Mat Modificat Laser Ion & Electron Beams, Dalian 116024, Peoples R China
[3] Tomsk Polytech Univ, Tomsk 634050, Russia
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2019年 / 90卷 / 10期
基金
美国国家科学基金会; 俄罗斯基础研究基金会;
关键词
INTENSITY PULSED ION; SURFACE; METALS; ENERGY; MASS;
D O I
10.1063/1.5116598
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The results of time-of-flight diagnostics of the composition of high-intensity pulsed ion beams are presented. The experiments were performed on a diode of focusing and flat geometry, in the mode of self-magnetic insulation of electrons (accelerating voltage 250-300 kV, pulse duration 120 ns, ion current density 20-300 A/cm(2)), and a focusing diode in an external magnetic insulation mode (300 kV, 80 ns, 100-200 A/cm(2)). A delay in the registration of protons by 40-50 ns (on the drift path 14-16 cm) was found in the absence of a delay in the registration of heavy ions. It has been shown that this delay can be related to the deceleration of light ions during the transport from the diode to a collimated Faraday cup. This effect of spatial compression of the ion beam in the direction of the drift increases its pulse power but complicates the time-of-flight diagnostics of its composition. Published under license by AIP Publishing.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Time-of-flight system for controlling the beam composition
    Batyuk, P.
    Gnesi, I.
    Grebenyuk, V.
    Nikiforov, A.
    Pontecorvo, G.
    Tosello, F.
    NUCLEAR ELECTRONICS & COMPUTING (NEC'2011), 2011, : 60 - 63
  • [2] Readout electronics of a prototype time-of-flight ion composition analyzer for space plasma
    Di Yang
    Zhe Cao
    Xin-Jun Hao
    Yi-Ren Li
    Shu-Bin Liu
    Chang-Qing Feng
    Qi An
    Nuclear Science and Techniques, 2018, 29
  • [3] Readout electronics of a prototype time-of-flight ion composition analyzer for space plasma
    Yang, Di
    Cao, Zhe
    Hao, Xin-Jun
    Li, Yi-Ren
    Liu, Shu-Bin
    Feng, Chang-Qing
    An, Qi
    NUCLEAR SCIENCE AND TECHNIQUES, 2018, 29 (04)
  • [4] THE SPACE-CHARGE INFLUENCE ON THE TRANSIENT FORM IN MEASUREMENTS BY THE TIME-OF-FLIGHT METHOD
    GORBAN, IS
    SHEVCHENKO, SY
    SUPRUN, AD
    UKRAINSKII FIZICHESKII ZHURNAL, 1989, 34 (06): : 939 - 943
  • [5] Development of a miniature time-of-flight mass/charge spectrometer for ion beam source analyzing
    Huang, Zhengxu
    Tan, Guobin
    Zhou, Zhen
    Chen, Lei
    Cheng, Liang
    Jin, Dazhi
    Tan, Xiaohua
    Xie, Chunguang
    Li, Lei
    Dong, Junguo
    Fu, Zhong
    Cheng, Ping
    Gao, Wei
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2015, 379 : 60 - 64
  • [6] CAMAC TIME-OF-FLIGHT ANALYZER FOR MOLECULAR-BEAM DIAGNOSTICS
    HUISKEN, F
    PERTSCH, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (06): : 1038 - 1041
  • [7] IMPROVED TIME-OF-FLIGHT ION CHARGE STATE DIAGNOSTIC
    BROWN, IG
    GALVIN, JE
    MACGILL, RA
    WRIGHT, RT
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (09): : 1589 - 1592
  • [8] Simple and inexpensive time-of-flight charge-to-mass analyzer for ion beam source characterization
    Gushenets, V. I.
    Nikolaev, A. G.
    Oks, E. M.
    Vintizenko, L. G.
    Yushkov, G. Yu.
    Oztarhan, A.
    Brown, I. G.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (06):
  • [9] SPACE-CHARGE EFFECTS IN THE ION TIME-OF-FLIGHT SPECTRA FOLLOWING NONRESONANT MULTIPHOTON IONIZATION
    DELISIO, C
    ALTUCCI, C
    BRUZZESE, R
    DIPALMA, T
    SOLIMENO, S
    SPINELLI, N
    TOSA, V
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1992, 25 (22) : 4781 - 4800
  • [10] Quantification of ionic-liquid ion source beam composition from time-of-flight data
    Jia-Richards, Oliver
    JOURNAL OF APPLIED PHYSICS, 2022, 132 (07)