Surface Characterization of Polymer Blends by XPS and ToF-SIMS

被引：41
|
作者：
Chan, Chi Ming [1 ,2 ]
Weng, Lu-Tao [2 ,3 ]
机构：
[1] Hong Kong Univ Sci & Technol, Div Environm, Kowloon, Hong Kong, Peoples R China
[2] Hong Kong Univ Sci & Technol, Dept Chem & Biomol Engn, Kowloon, Hong Kong, Peoples R China
[3] Hong Kong Univ Sci & Technol, Mat Characterizat & Preparat Facil, Kowloon, Hong Kong, Peoples R China
来源：
MATERIALS | 2016年 / 9卷 / 08期
关键词：
polymer blends; surface structures and chemical properties; ToF-SIMS; XPS; ION MASS-SPECTROMETRY; RAY PHOTOELECTRON-SPECTROSCOPY; POLY(ETHYLENE OXIDE); MOLECULAR-WEIGHT; POLY(L-LACTIC ACID); PYRIDINE) BLENDS; SEGREGATION; POLYETHYLENE; MORPHOLOGY; POLY(EPSILON-CAPROLACTONE);
D O I：
10.3390/ma9080655
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.
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收藏
页数：19
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