Contact angle hysteresis on nano-structured surfaces

被引:61
|
作者
Ramos, SMM
Charlaix, E
Benyagoub, A
机构
[1] Univ Lyon 1, CNRS, UMR 5586, Lab Phys Mat Condensee & Nanostruct, F-69622 Villeurbanne, France
[2] Ctr Interdisciplinaire Rech Ions Lourds, F-14040 Caen 5, France
关键词
contact; wetting; surface defects; ion bombardment;
D O I
10.1016/S0039-6028(03)00852-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present results from an experimental study on the phenomenon of contact angle hysteresis on solid surfaces decorated by a random array of nanometric hollows. For weak values of the areal density of defects phi(d), the hysteresis H increases linearly with phi(d). This evolution is described by a pinning-depinning process of the contact line by individual defects. At higher values Of phi(d), a collective pinning effect appears and H decreases with increasing phi(d). In the linear regime, our experimental results are compared to theoretical predictions for contact angle hysteresis induced by a single isolated defect on the solid surface. We suggest that the crossover from the individual to the collective pinning effects could be interpreted in terms of an overlapping of wetting cross sections. Finally, we analyse the influence of both the size and the morphology (hollows/hillocks) of defects on the anchorage of the contact line. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:355 / 362
页数:8
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