BATTLING PHASE NOISE AT RF AND MICROWAVE FREQUENCIES

被引：0
|
作者：
Hansen, John [1 ]
机构：
[1] Agilent Technol, Santa Clara, CA USA
来源：
MICROWAVE JOURNAL | 2011年 / 54卷 / 04期
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：104 / +
页数：4
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