Design and test of self-checking asynchronous control circuit

The application of asynchronous circuit has been greatly restricted by reason of lacking effective technologies to test. Making use of the self-checking property of asynchronous control circuit, we may preferably solve this problem. In the paper, we put forward an improved, fail-stop David Cell, describe a way of designing self-checking asynchronous control circuits by the direct mapping technique, and propose the testing method for single stuck-at faults. The result shows that self-checking counterpart can be tested at normal operation speed and the area overhead is acceptable.