Application of MatLab for Solid Surface Analysis by Means of X-ray Photoelectron Spectroscopy

被引：0
|
作者：
Lubenchenko, A. V. [1 ]
Lubenchenko, O. I. [1 ]
Ivanov, D. A. [1 ]
Ivanova, I. V. [1 ]
机构：
[1] Natl Res Univ, Moscow Power Engn Inst, Moscow, Russia
来源：
2018 IV INTERNATIONAL CONFERENCE ON INFORMATION TECHNOLOGIES IN ENGINEERING EDUCATION (INFORINO) | 2018年
关键词：
XPS; MatLab; chemical and phase depth profiling; students' research;
D O I：
暂无
中图分类号：
G40 [教育学];
学科分类号：
040101 ; 120403 ;
摘要：
Efficiency of using the MatLab package to solve the problems of analysis of solid by means of X-ray photoelectron spectroscopy. A high-level programming language, fast matrix libraries MatLab, Signal Processing Toolbox and Curve Fitting Toolbox enabled to use more complicated, physically grounded calculation models for chemical and phase depth profiling of solid and calculate thicknesses of sub-surface layers with a sub-monolayer accuracy. The approach is used in educational and scientific students' research.
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页数：5
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