Note: Advancement in tip etching for preparation of tunable size scanning tunneling microscopy tips

被引:3
|
作者
Corbett, J. P. [1 ]
Pandya, S. G. [1 ]
Mandru, A. -O. [1 ]
Pak, J. [1 ]
Kordesch, M. E. [1 ]
Smith, A. R. [1 ]
机构
[1] Ohio Univ, Dept Phys & Astron, Nanoscale & Quantum Phenomena Inst, Athens, OH 45701 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2015年 / 86卷 / 02期
基金
美国国家科学基金会;
关键词
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I
10.1063/1.4907706
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The two aspects of a scanning tunneling microscopy tip, the macroscopic profile and the nanoscale apex, can be tailored by controlling the tension during electrochemical etching and the solution-electrode contact area via acetone vapor. The apex diameter is shown to be proportional to the square root of the tension, and is demonstrated over apex diameters of 150-500 nm. The apex was found to be created in four distinct shapes where a secondary etching can reshape the tip into a single geometry. Improvement in tip height and stability of the profile are demonstrated versus a non-acetone fabrication control. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:3
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