The out-of-plane correlation length of the conformal roughness in Co-Pd multilayers

被引：2
|
作者：
Pym, ATG
Rozatian, ASH
Marrows, CH
Hickey, BJ
Hase, TPA
Tanner, BK
机构：
[1] Univ Durham, Dept Phys, Durham DH1 3LE, England
[2] Univ Leeds, Dept Phys, Leeds LS2 9JT, W Yorkshire, England
来源：
PHYSICA B-CONDENSED MATTER | 2005年 / 357卷 / 1-2期
关键词：
Co/Pd multilayers; x-ray scattering; interface roughness;
D O I：
10.1016/j.physb.2004.11.050
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The out-of-plane correlation length of the conformal roughness of a series of Co-Pd multilayers has been measured as a function of multilayer repeat number and the value averaged over all frequencies was found to be almost constant. The in-plane length scale over which scaling behaviour is observed decreases as the number of repeats increases. No systematic trend in the scaling exponents could be detected as a function of bilayer repeat number. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：170 / 174
页数：5
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