adjusted average time to signal;
adaptive control charts;
runs rules;
sample standard deviation;
process variation;
Shewhart control charts;
VARIABLE SAMPLING INTERVALS;
ADAPTIVE-CONTROL CHARTS;
RUNS RULES;
(X)OVER-BAR CHARTS;
XBAR-CHARTS;
DESIGN;
SIZES;
VARIANCE;
SCHEMES;
ISSUES;
D O I:
10.1080/02664763.2011.570320
中图分类号:
O21 [概率论与数理统计];
C8 [统计学];
学科分类号:
020208 ;
070103 ;
0714 ;
摘要:
The most common charting procedure used for monitoring the variance of the distribution of a quality characteristic is the S control chart. As a Shewhart-type control chart, it is relatively insensitive in the quick detection of small and moderate shifts in process variance. The performance of the S chart can be improved by supplementing it with runs rules or by varying the sample size and the sampling interval. In this work, we introduce and study one-sided adaptive S control charts, supplemented or not with one powerful runs rule, for detecting increases or decreases in process variation. The properties of the proposed control schemes are obtained by using a Markov chain approach. Furthermore, a practical guidance for the choice of the most suitable control scheme is also provided.