On the improvement of one-sided S control charts

被引:19
|
作者
Rakitzis, Athanasios C. [2 ]
Antzoulakos, Demetrios L. [1 ]
机构
[1] Univ Piraeus, Dept Stat & Insurance Sci, Piraeus, Greece
[2] Univ Aegean, Dept Stat & Actuarial Financial Math, Aegean, Greece
关键词
adjusted average time to signal; adaptive control charts; runs rules; sample standard deviation; process variation; Shewhart control charts; VARIABLE SAMPLING INTERVALS; ADAPTIVE-CONTROL CHARTS; RUNS RULES; (X)OVER-BAR CHARTS; XBAR-CHARTS; DESIGN; SIZES; VARIANCE; SCHEMES; ISSUES;
D O I
10.1080/02664763.2011.570320
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
The most common charting procedure used for monitoring the variance of the distribution of a quality characteristic is the S control chart. As a Shewhart-type control chart, it is relatively insensitive in the quick detection of small and moderate shifts in process variance. The performance of the S chart can be improved by supplementing it with runs rules or by varying the sample size and the sampling interval. In this work, we introduce and study one-sided adaptive S control charts, supplemented or not with one powerful runs rule, for detecting increases or decreases in process variation. The properties of the proposed control schemes are obtained by using a Markov chain approach. Furthermore, a practical guidance for the choice of the most suitable control scheme is also provided.
引用
收藏
页码:2839 / 2858
页数:20
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