Reliability Evaluation of Conventional and Interleaved DC-DC Boost Converters

被引:150
|
作者
Khosroshahi, Alireza [1 ]
Abapour, Mehdi [1 ]
Sabahi, Mehran [1 ]
机构
[1] Univ Tabriz, Dept Elect & Comp Engn, Tabriz 5166615813, Iran
关键词
Interleaved dc-dc converters; power electronics; reliability; POWER ELECTRONIC CONVERTERS; GATE OXIDE RELIABILITY; SYSTEM; MOSFET; IGBTS;
D O I
10.1109/TPEL.2014.2380829
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Obviously for the correct operation of conventional boost converters, all components should work correctly. Interleaved boost converters having several stages, can be used to increase the reliability. So in this paper, a reliability comparison is done between the conventional boost converter and the interleaved structure. Two different operation modes are defined for the interleaved boost converter: half-power and full-power operation modes. The reliability calculation is based on the Markov model of the converters. The power loss effect of converter components on their failure rates, and therefore, on the reliability of converter has been assessed. For the first time different failure rates have been considered for different operation modes. Also a laboratory prototype of a two-stage interleaved boost dc-dc converter has been built up and the failure rate of components in different operation modes are calculated practically. Results show that in addition to other benefits, interleaved structure has higher reliability and as the power increases, there will be a decrease in the reliability.
引用
收藏
页码:5821 / 5828
页数:8
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