Electric-field induced morphological transitions in elastic contact instability of soft solid films

被引:14
|
作者
Arun, N.
Sarkar, J.
Sharma, Ashutosh
Shenoy, V. B.
Narayan, K. S. [1 ]
机构
[1] Jawaharlal Nehru Ctr Adv Sci Res, Bangalore 560064, Karnataka, India
[2] Indian Inst Technol, Dept Chem Engn, Kanpur 208016, Uttar Pradesh, India
[3] Indian Inst Sci, Ctr Condensed Matter Theory, Mat Res Ctr, Bangalore 560012, Karnataka, India
来源
JOURNAL OF ADHESION | 2007年 / 83卷 / 06期
关键词
electric field; meniscus instability; PDMS; van der Waals forces;
D O I
10.1080/00218460701453486
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
A soft elastic film, when placed in adhesive proximity with a contactor in a cracklike geometry, spontaneously undergoes a surface instability to form finger patterns with a characteristic wavelength of approximately 4h, where h is the film thickness. We study the morphological evolution and control of this elastic contact instability under the influence of an external electric field. The distinct electric field induced morphological changes, leading to the formation of two-dimensional hexagonally arranged pillars, large-amplitude fingers, and straightening of contact edge, which are studied comprehensively. The conditions for the evolution of morphologically distinct patterns are governed by the film parameters, such as its shear modulus and thickness. A theoretical model and its stability analysis provide an approximate estimate of the critical voltage required for the onset of changes and its scaling with the film parameters (thickness and shear modulus). Further, three-dimensional simulations based on energy minimization are presented to provide important clues regarding the physics of pattern evolution on soft elastic interfaces.
引用
收藏
页码:513 / 534
页数:22
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