Development of a mathematical model for thermal-compression bonding of the COG packaging process using NCA

被引:1
|
作者
Chang, Ching-Ho [1 ]
Young, Wen-Bin [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Aeronaut & Astronaut, Tainan 70101, Taiwan
关键词
RELIABILITY; FLOW; PERFORMANCE;
D O I
10.1016/j.microrel.2010.11.012
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this decade, many new techniques have been introduced into the integrated circuit (IC) packaging industry. Packaging technology used in liquid crystal displays (LCDs) has requirements related to critical issues such as high density interconnects, thinner packaging size, and environmental safety. Driver IC chips are directly attached to LCD panels using flip chip technology with adhesives in the so called chip on glass (COG) packaging processes. To investigate the dependence of the bonding force on the bump deformation during packaging, this study established a mathematical model to analyze COG packaging processes with non-conductive adhesives (NCAs). The plastic deformation of the bumps and the NCA flow between the chip and substrate are taken into account in this model. With this model, the contact resistance and the gap height after bonding can be estimated for different bonding force. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:860 / 865
页数:6
相关论文
共 50 条
  • [21] A New Mathematical Model for Food Thermal Process Prediction
    Friso, Dario
    MODELLING AND SIMULATION IN ENGINEERING, 2013, 2013
  • [22] Mathematical model of the pellet thermal process in an annular cooler
    Feng, Jun-Xiao
    Liang, Kai-Li
    Zhang, Cai
    Xu, Jing-Hai
    Zhang, Yong-Ming
    Yang, Jin-Bao
    Beijing Keji Daxue Xuebao/Journal of University of Science and Technology Beijing, 2010, 32 (12): : 1596 - 1600
  • [23] Development of compression molding process for Fan-Out wafer level packaging
    Julien, Bertheau
    Fabrice, Duval F. C.
    Tadashi, Kubota
    Pieter, Bex
    Koen, Kennes
    Alain, Phommahaxay
    Arnita, Podpod
    Eric, Beyne
    Andy, Miller
    Gerald, Beyer
    2020 IEEE 70TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2020), 2020, : 1965 - 1972
  • [24] Stress evaluation of flip chip bonding die by thermal compression bonding using Raman spectroscopy
    Ito, Mototaka
    Uchida, Tomoyuki
    Sugie, Ryuichi
    2016 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), 2016, : 465 - 468
  • [25] Thermal Compression Bonding for Power IC Attachment Using Pure Zn
    Fan, Chih-Hao
    Wu, Ting-Jui
    Song, Jenn-Ming
    2016 International Conference on Electronics Packaging (ICEP), 2016, : 411 - 414
  • [26] Pressureless bonding process using Ag nanoparticle paste for flexible electronics packaging
    Yan, Jianfeng
    Zou, Guisheng
    Wu, Ai-ping
    Ren, Jialie
    Yan, Jiuchun
    Hu, Anming
    Zhou, Y.
    SCRIPTA MATERIALIA, 2012, 66 (08) : 582 - 585
  • [27] Thermo-mechanical Analysis of Thermal Compression Bonding Chip-Join Process
    Chowdhury, Prabudhya Roy
    Sakuma, Katsuyuki
    Raghavan, Sathya
    Bergendahl, Marc
    Sikka, Kamal
    Kohara, Sayuri
    Hisada, Takashi
    Mori, Hiroyuki
    Taneja, Divya
    De Sousa, Isabel
    IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022), 2022, : 579 - 585
  • [28] Development of a Cardiovascular Mathematical Model Considering the Thermal Environment
    Xia, Zhouzheng
    Ishikawa, Yusuke
    Kaneko, Shigehiko
    Kusaka, Jin
    PERSPECTIVES IN DYNAMICAL SYSTEMS II-NUMERICAL AND ANALYTICAL APPROACHES, DSTA 2021, 2024, 454 : 715 - 736
  • [29] A kinetic model of copper-to-copper direct bonding under thermal compression
    Shie, Kai-Cheng
    Gusak, A. M.
    Tu, K. N.
    Chen, Chih
    JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, 2021, 15 : 2332 - 2344
  • [30] Mathematical model of the development of an epidemic process with aerosol transmission
    Kolesin I.D.
    Biophysics, 2007, 52 (1) : 92 - 94