BACK ELECTRODE INFLUENCE ON OPTO-ELECTRONIC PROPERTIES OF ORGANIC PHOTOVOLTAIC BLEND CHARACTERIZED BY KELVIN PROBE FORCE MICROSCOPY

被引：0
|
作者：
Cermak, Jan [1 ]
Miliaieva, Daria [1 ,2 ]
Hoppe, Harald [3 ]
Rezek, Bohuslav [1 ,2 ]
机构：
[1] Czech Acad Sci, Inst Phys, Prague, Czech Republic
[2] Czech Tech Univ, Fac Elect Engn, Prague, Czech Republic
[3] Ctr Energy & Environm Chem Jena, Jena, Germany
来源：
8TH INTERNATIONAL CONFERENCE ON NANOMATERIALS - RESEARCH & APPLICATION (NANOCON 2016) | 2017年
关键词：
Organic photovoltaics; Kelvin Probe Force Microscopy; degradation; SOLAR-CELLS; POLYMER;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Organic photovoltaic (PV) system consisting of P3HT:PCBM blend layer was prepared with an aluminum (Al) back electrode. After the final thermal annealing the Al layer was partially removed. Kelvin Probe Force Microscopy (KPFM) was used to measure photovoltage response to illumination by a solar spectrum light as a function of time (up to 3 weeks). Comparison of the same KPFM measurement on the areas with and without Al revealed differences in both morphology and photovoltage response to illumination. The data are discussed with view to reducing degradation of organic PV devices.
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页码：291 / 295
页数：5
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