The function of buffer layers and defects in heteroepitaxial BaxSr1-xTiO3/YBa2Cu3O7-x/CeO2/Y-ZrO2/Si/Al2O3 multilayers

被引：0
|
作者：
Olsson, E [1 ]
Boikov, Y [1 ]
Ivanov, ZG [1 ]
Vasiliev, AL [1 ]
Claeson, T [1 ]
机构：
[1] CHALMERS UNIV TECHNOL,DEPT PHYS,S-41296 GOTHENBURG,SWEDEN
来源：
EPITAXIAL OXIDE THIN FILMS II | 1996年 / 401卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
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页码：321 / 332
页数：12
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