Unsupervised recycled FPGA detection using exhaustive nearest neighbor residual analysis

被引:0
|
作者
Isaka, Yuya [1 ]
Shintani, Michihiro [1 ]
Inoue, Michiko [1 ]
机构
[1] Nara Inst Sci & Technol NAIST, Grad Sch Sci & Technol, Nara 6300192, Japan
关键词
Recycled FPGA detection; Process variation; Nearest neighbor residual; Exhaustive path fingerprinting; Unsupervised outlier detection; Ring oscillator; COUNTERFEIT INTEGRATED-CIRCUITS;
D O I
10.35848/1347-4065/ac5107
中图分类号
O59 [应用物理学];
学科分类号
摘要
Measuring and analyzing aging-induced delay degradation of ring oscillators (ROs) is an effective method to detect recycled field-programmable gate arrays (FPGAs). However, detection methods of conventional recycled FPGAs detection methods assume the existence of known fresh FPGAs (KFFs) as training data for machine-learning-based classification, which is an unrealistic assumption. In this paper, we propose an unsupervised recycled FPGA detection method, where little information on KFF is available. In the proposed method, estimated frequency is calculated from neighboring ROs, and then the residual frequency between the measured and estimated frequencies is used for the detection. Because of the systematic component of process variation, the frequencies of neighboring ROs should be similar when the target FPGA is fresh. Therefore, if the residual is high, the target FPGA is determined as recycled. Experiments using 25 commercial FPGAs under various aging scenarios demonstrate that the proposed method successfully distinguishes between recycled and fresh FPGAs.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization
    Alam, Md Mahbub
    Tehranipoor, Mark
    Forte, Domenic
    PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2016,
  • [2] Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling
    Alam, Md Mahbub
    Tehranipoor, Mark
    Forte, Domenic
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 27 (12) : 2897 - 2910
  • [3] Residual variance estimation using a nearest neighbor statistic
    Liitiainen, Elia
    Corona, Francesco
    Lendasse, Amaury
    JOURNAL OF MULTIVARIATE ANALYSIS, 2010, 101 (04) : 811 - 823
  • [4] A Fast k-Nearest Neighbor Classifier Using Unsupervised Clustering
    Vajda, Szilard
    Santosh, K. C.
    RECENT TRENDS IN IMAGE PROCESSING AND PATTERN RECOGNITION (RTIP2R 2016), 2017, 709 : 185 - 193
  • [5] Object detection with a nearest neighbor classifier based on residual vector quantization
    Barnes, CF
    TERRORISM AND COUNTERTERRORISM METHODS AND TECHNOLOGIES, 1997, 2933 : 77 - 85
  • [6] Aging Analysis for Recycled FPGA Detection
    Dogan, Halit
    Forte, Domenic
    Tehranipoor, Mark
    PROCEEDINGS OF THE 2014 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFTS), 2014, : 171 - 176
  • [7] Unsupervised Recycled FPGA Detection Based on Direct Density Ratio Estimation
    Isaka, Yuya
    Ahmed, Foisal
    Shintani, Michihiro
    Inoue, Michiko
    2021 IEEE 27TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS), 2021,
  • [8] Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling
    Ahmed, Foisal
    Shintani, Michihiro
    Inoue, Michiko
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2021, 40 (08) : 1626 - 1639
  • [9] Spatial cluster detection using nearest neighbor distance
    Bar-Hen, Avner
    Emily, Mathieu
    Picard, Nicolas
    SPATIAL STATISTICS, 2015, 14 : 400 - 411
  • [10] Intrusion Detection Using k-Nearest Neighbor
    Govindarajan, M.
    Chandrasekaran, R. M.
    FIRST INTERNATIONAL CONFERENCE ON ADVANCED COMPUTING 2009 (ICAC 2009), 2009, : 13 - +