Very high-speed metal-semiconductor-metal ultraviolet photodetectors fabricated on GaN

被引:79
|
作者
Carrano, JC [1 ]
Li, T [1 ]
Brown, DL [1 ]
Grudowski, PA [1 ]
Eiting, CJ [1 ]
Dupuis, RD [1 ]
Campbell, JC [1 ]
机构
[1] Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA
关键词
D O I
10.1063/1.122448
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the temporal and the frequency response of metal-semiconductor-metal ultraviolet photodetectors fabricated on single-crystal GaN. The best devices show a fast 10%-90% rise time of similar to 23 ps implying a bandwidth of >15 GHz. These time domain data have been corroborated by direct measurement of the power spectral content. From this a cutoff frequency, f (3dB), of similar to 16 GHz dB has been obtained. Analysis in terms of reverse bias and geometric scaling indicates that the photodetectors are transit-time limited. Modeling of the temporal behavior indicates that a slow component in the time and frequency response data is a consequence of the hole drift velocity. (C) 1998 American Institute of Physics. [S0003-6951(98)03043-5].
引用
收藏
页码:2405 / 2407
页数:3
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