On the reliability of quantitative phase measurements by low magnification off-axis image plane electron holography

被引：8
|
作者：
Frost, BG [1 ]
Voelkl, E
机构：
[1] Univ Tennessee, EM Facil, Knoxville, TN 37996 USA
[2] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
来源：
ULTRAMICROSCOPY | 1998年 / 72卷 / 3-4期
关键词：
electron holography;
D O I：
10.1016/S0304-3991(98)00015-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We experimentally found that the object wave function of an electron wave in a transmission electron microscope can depend on the diameter of the condenser aperture and on the excitation of the objective lens. This can be seen by low magnification holograms utilizing as sample electrically charged latex spheres of different diameters, the electric field at a pn-junction and the magnetic leakage field of a magnetic memory cell. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
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页码：101 / 107
页数：7
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