Thermally driven single-electron stochastic resonance

被引:1
|
作者
Kasai, Seiya [1 ,2 ,3 ]
机构
[1] Hokkaido Univ, Res Ctr Integrated Quantum Elect, North 13,West 8, Sapporo, Hokkaido 0600813, Japan
[2] Hokkaido Univ, Grad Sch Informat Sci & Technol, North 14,West 9, Sapporo, Hokkaido 0600814, Japan
[3] Hokkaido Univ, Ctr Human Nat Artificial Intelligence & Neurosci, North 12,West 7, Sapporo, Hokkaido 0600812, Japan
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
single electron; stochastic resonance; thermal fluctuation; GaAs nanowire; theoretical model; nonlinear; WRAP-GATE CONTROL; TRANSISTORS; NOISE; CONDUCTANCE;
D O I
10.1088/1361-6528/ac9188
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Stochastic resonance (SR) in a single-electron system is expected to allow information to be correctly carried and processed by single electrons in the presence of thermal fluctuations. Here, we comprehensively study thermally driven single-electron SR. The response of the system to a weak voltage signal is formulated by considering the single-electron tunneling rate, instead of the Kramers' rate generally used in conventional SR models. The model indicates that the response of the system is maximized at finite temperature and that the peak position is determined by the charging energy. This model quantitatively reproduces the results of a single-electron device simulator. Single-electron SR is also demonstrated using a GaAs-based single-electron system that integrates a quantum dot and a high-sensitivity charge detector. The developed model will contribute to our understanding of single-electron SR and will facilitate accurate prediction, design, and control of single-electron systems.
引用
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页数:8
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