Study of pathway of hydrogen migration and desorption on SiGe(100) surface using ab initio calculations

被引:3
|
作者
Cheng, CL [1 ]
Tsai, DS [1 ]
Jiang, JC [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Chem Engn, Taipei 106, Taiwan
关键词
ab initio calculation; cluster model; H-atom migration; H(2) desorption; SiGe;
D O I
10.1143/JJAP.44.7625
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ab initio calculations have been carried out to investigate the pathways of H-atom migration and H(2) desorption on a mixed SiGe(100)-2 x 1 surface using the cluster model. The H(2) recombinative desorption is the rate-detemining step in hydrogen migration and desorption on SiGe(100) surfaces, since the energy barrier to H-atom migration is generally lower than that of H(2) desorption. The energy barriers for H, desorption from the interdimer, the Si-Ge pair, (52.8 kcal/mol), and the Ge-Ge pair, (45.1 kcal/mol), are lower than that for the Si-Si pair by 7.5 and 15.2 kcal/mol, respectively. Thus, the SiGe(100)-2 x 1 surface in chemical vapor deposition provides more dangling bonds than the Si(100)-2 x 1 surface because of Ge inclusion. In contrast, the chemisorbed H tends to stay on the Si-site, since the barrier for H-migration from the Ge-site to the Si-site is lower that in the opposite direction by 5.6 kcal/mol. Hence, a considerably higher percentage of Ge sites are dangling bonds, compared with Si sites on the SiGe(100) surface. Related transition state structures in the migration and desorption steps are also discussed.
引用
收藏
页码:7625 / 7633
页数:9
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