Sensitivity Analysis of Passive Intermodulation Due to Electrical Contacts

被引:4
|
作者
Treviso, Felipe [1 ]
Trinchero, Riccardo [1 ]
Keski-Opas, Petri [2 ]
Kelander, Ilkka [2 ]
Canavero, Flavio G. [1 ]
机构
[1] Politecn Torino, I-10129 Turin, Italy
[2] Huawei Technol Oy Finland Co Ltd, Helsinki 00620, Finland
关键词
Contacts; Computational modeling; Integrated circuit modeling; Analytical models; Mathematical models; Sensitivity analysis; Metals; Electrical contact; passive intermodulation (PIM); sensitivity analysis; support vector machine (SVM); surrogate model; MODELS; DESIGN; PIM;
D O I
10.1109/TEMC.2022.3142963
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nonlinear phenomena in electrical contacts deteriorate the quality of communication systems with the production of passive intermodulation (PIM). The theoretical evaluation of PIM as a function of the physical parameters of the contact is rather complicated. Standard linear and macroscopic contact models do not take into account all microscopic aspects of the contact responsible for its nonlinear behavior. For the above reason, an accurate analysis of the PIM should be carried out by using microscopic contact models, defined by dozens of parameters, some of which cannot be precisely measured or estimated. This article presents a statistical analysis of the PIM level by taking into account a possible uncertain interval for the physical parameters of the contact. Such statistical interpretation is then used in order to identify the most relevant physical parameters for the PIM generation via a sensitivity analysis, through the use of a surrogate model that speeds up the huge amount of PIM computations. The results of the sensitivity analysis allow us to build a simpler model depending only on few dominant parameters.
引用
收藏
页码:760 / 769
页数:10
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