Characteristics of waveguide photodetectors at high-power optical input

被引:9
|
作者
Choe, JS [1 ]
Kwon, YH [1 ]
Kim, K [1 ]
机构
[1] Elect & Telecommun Res Inst, Taejon 305350, South Korea
关键词
optical confinement factor; photodetector (PD); quantum well; reliability; saturated output;
D O I
10.1109/LPT.2005.844003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-power characteristics of waveguide photodetectors (PDs) with various absorbing layer thicknesses were analyzed. When large photocurrent was generated by high-power optical input, the saturation of radio frequency response was closely related with the optical absorption efficiency. The device with a single quantum well absorbing layer showed no saturation behavior until the device failure, while PDs with a thicker absorbing layer were saturated at photocurrent of a few milliamperes. It was also found that as optical confinement decreases, the maximum photocurrent the device can endure increases by more than three times.
引用
收藏
页码:881 / 883
页数:3
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