Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

被引：34

作者：

Wright, GW ^{[1
]}

James, RB ^{[1
]}

Chinn, D ^{[1
]}

Brunett, BA ^{[1
]}

Olsen, RW ^{[1
]}

Van Scyoc, J ^{[1
]}

Clift, M ^{[1
]}

Burger, A ^{[1
]}

Chattopadhyay, K ^{[1
]}

Shi, D ^{[1
]}

Wingfield, R ^{[1
]}

机构：

[1] Sandia Natl Labs, Livermore, CA 94551 USA

来源：

HARD X-RAY GAMMA-RAY AND NEUTRON DETECTOR PHYSICS II | 2000年 / 4141卷

关键词：

D O I：

10.1117/12.407594

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Various passivating agents that reduced the surface leakage current of CZT crystals have been previously reported. In one of the studies, NH4F/H2O2 was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH4F/H2O2 treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH4F/H2O2 surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH4F/N2O2 treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.

引用

页码：324 / 335

页数：12

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