Evaluation of principal residual stress and its relationship with crystal orientation and mechanical properties of polypropylene films

被引:17
|
作者
Shi, Ying [1 ]
Zheng, Cui [1 ]
Ren, Minqiao [1 ]
Tang, Yujing [1 ]
Liu, Li-Zhi [1 ]
He, Bob [2 ]
机构
[1] Sinopec Beijing Res Inst Chem Ind, Beijing 100013, Peoples R China
[2] Bruker AXS Inc, 5465 East Cheryl Pkwy, Madison, WI 53711 USA
关键词
XRD; Principal residual stress; Polypropylene; Crystal orientation; Mechanical property;
D O I
10.1016/j.polymer.2017.07.006
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Evaluation of principal residual stress with X-Ray diffraction for metals has been widely practiced, but not for polymers due to a large fraction of amorphous phase, though it is very important for many engineering applications. Such a method is established for rigid semicrystalline polymer with rubber amorphous which, in the present work, are defined as the polymers with an amorphous rubber phase and a crystal matrix (rigid crystal network) providing its plastic modulus. An equal strain model between crystal and amorphous phases and the Young's modulus contributed by both crystal and amorphous phases, instead of moduli from crystal region, are justified for the stress evaluation for rigid semicrystalline polymers. The principal residual stresses obtained with our approach show a very good correlation with crystal orientation and the anisotropic mechanical properties of the polymer films studied. The established method can be widely used for rigid semicrystalline polymers with rubbery amorphous. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:137 / 143
页数:7
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