Equilibrium configurations of epitaxially strained thin films

被引：0
|
作者：
Fusco, Nicola [1 ]
机构：
[1] Univ Naples Federico 2, Dipartimento Matemat & Applicaz, Naples 80126, Italy
来源：
RENDICONTI LINCEI-MATEMATICA E APPLICAZIONI | 2010年 / 21卷 / 03期
关键词：
Free boundary problems; regularity; local minimality; second variation; CRYSTALLINE FILMS; FREE-BOUNDARY; REGULARITY;
D O I：
10.4171/RLM/576
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
We present some regularity results on equilibrium configurations for a variational model introduced to describe the epitaxial growth of an elastic film over a thick flat substrate when a lattice mismatch between the two materials is present. We also give a sufficient condition for local minimality based on second variation and apply it to determine analitycally the critical threshold for the local minimality of the flat configuration.
引用
收藏
页码：341 / 348
页数：8
相关论文
共 50 条
12345