High-precision laser-assisted absolute determination of x-ray diffraction angles

被引:22
|
作者
Kubicek, K. [1 ]
Braun, J. [1 ]
Bruhns, H. [1 ]
Lopez-Urrutia, J. R. Crespo [1 ]
Mokler, P. H. [1 ]
Ullrich, J. [1 ]
机构
[1] Max Planck Inst Nucl Phys, D-69117 Heidelberg, Germany
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2012年 / 83卷 / 01期
关键词
BEAM ION-TRAP; HIGH-FREQUENCY SPECTRA; ARGON RECOIL IONS; HELIUM-LIKE IONS; 1S LAMB SHIFT; WAVELENGTH MEASUREMENTS; CHARGED IONS; SPECTROSCOPY; ELEMENTS; PHYSICS;
D O I
10.1063/1.3662412
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel technique for absolute wavelength determination in high-precision crystal x-ray spectroscopy recently introduced has been upgraded reaching unprecedented accuracies. The method combines visible laser beams with the Bond method, where Bragg angles (theta and -theta) are determined without any x-ray reference lines. Using flat crystals this technique makes absolute x-ray wavelength measurements feasible even at low x-ray fluxes. The upgraded spectrometer has been used in combination with first experiments on the 1s2p P-1(1) -> 1s(2) S-1(0) w-line in He-like argon. By resolving a minute curvature of the x-ray lines the accuracy reaches there the best ever reported value of 1.5 ppm. The result is sensitive to predicted second-order QED contributions at the level of two-electron screening and two-photon radiative diagrams and will allow for the first time to benchmark predicted binding energies for He-like ions at this level of precision. (C) 2012 American Institute of Physics. [doi:10.1063/1.3662412]
引用
收藏
页数:8
相关论文
共 50 条
  • [1] A high-precision spectrometer for the absolute determination of X-ray absorption edges as calibration standards
    Stumpel, J
    Becker, P
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 489 - 500
  • [2] HIGH-PRECISION ALIGNMENT OF X-RAY TRANSMISSION DIFFRACTION GRATINGS
    HAWRYLUK, AM
    HILL, SL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (03): : 420 - 422
  • [3] High-Precision X-Ray Polarimetry
    Marx, B.
    Schulze, K. S.
    Uschmann, I.
    Kaempfer, T.
    Loetzsch, R.
    Wehrhan, O.
    Wagner, W.
    Detlefs, C.
    Roth, T.
    Haertwig, J.
    Foerster, E.
    Stoehlker, T.
    Paulus, G. G.
    PHYSICAL REVIEW LETTERS, 2013, 110 (25)
  • [4] HIGH-PRECISION X-RAY METROLOGY
    SEYFRIED, P
    BECKER, P
    WINDISCH, D
    PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1988, 10 (01): : 35 - 42
  • [5] High-precision x-ray diagnostics of laser-produced plasmas
    Renner, O
    Förster, E
    Uschmann, I
    Eidmann, K
    LASER OPTICS 2003: SUPERINTENSE LIGHT FIELDS AND ULTRAFAST PROCESSES, 2003, 5482 : 1 - 10
  • [6] HIGH-PRECISION X-RAY MASK TECHNOLOGY
    OHKI, S
    YOSHIHARA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1990, 29 (11): : 2600 - 2604
  • [7] Determination of absolute configuration using X-ray diffraction
    Parsons, Simon
    TETRAHEDRON-ASYMMETRY, 2017, 28 (10) : 1304 - 1313
  • [8] LASER-ASSISTED EFFECTS IN X-RAY LASER RECOMBINATION PUMPING
    CHICHKOV, BN
    USKOV, DB
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (116): : 127 - 130
  • [9] VERY HIGH PRECISION X-RAY DIFFRACTION
    BAKER, TW
    GEORGE, JD
    BELLAMY, BA
    CAUSER, R
    NATURE, 1966, 210 (5037) : 720 - &
  • [10] COMBINED HIGH-PRECISION X-RAY-DIFFRACTION APPARATUS
    WEYERER, H
    ACTA PHYSICA AUSTRIACA, 1973, 37 (1-2): : 38 - 45