Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001)

被引:54
|
作者
Allers, W
Schwarz, A
Schwarz, UD
Wiesendanger, R
机构
[1] Univ Hamburg, Inst Phys Appl, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany
关键词
non-contact atomic force microscopy; low-temperature atomic force microscopy; graphite; HOPG; van der Waals;
D O I
10.1016/S0169-4332(98)00535-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The (0001) surface of highly oriented pyrolytic graphite is studied by scanning force microscopy in both contact and dynamic mode. Low temperatures were necessary for the dynamic mode measurements in order to achieve the required signal to noise ratio. At 22 K, atomic scale structures with 2.46 Angstrom periodicity and trigonal symmetry of the individual maxima were obtained in both modes. Since graphite exhibits a van der Waals surface in good approximation, this result shows that comparatively weak forces of van der Waals type are sufficient for successful imaging in the dynamic mode on the atomic scale. However, since the positions of the observed maxima correspond to the ones found by scanning tunneling microscopy and contact scanning force microscopy, but not to the positions of the carbon atoms, it also opens new questions on the imaging mechanism in the dynamic mode. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:247 / 252
页数:6
相关论文
共 50 条
  • [1] Dynamic scanning force microscopy at low temperatures
    Allers, W
    Schwarz, A
    Hölscher, H
    Schwarz, UD
    Wiesendanger, R
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B): : 3701 - 3706
  • [2] Dynamic scanning force microscopy at low temperatures
    [J]. Allers, Wolf, 1600, JJAP, Tokyo, Japan (39):
  • [3] Evaluation of the van der Waals force for atomic force microscopy
    Bruch, LW
    [J]. PHYSICAL REVIEW B, 2005, 72 (03)
  • [4] Mapping van der Waals forces with frequency modulation dynamic force microscopy
    Polesel-Maris, J.
    Guo, H.
    Zambelli, T.
    Gauthier, S.
    [J]. NANOTECHNOLOGY, 2006, 17 (16) : 4204 - 4211
  • [5] Surface enhanced van der Waals force
    Tomas, Marin-Slobodan
    [J]. PHYSICA SCRIPTA, 2009, T135
  • [6] Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy
    Stifter, T
    Marti, O
    Bhushan, B
    [J]. PHYSICAL REVIEW B, 2000, 62 (20) : 13667 - 13673
  • [7] Geometry effects on the van der Waals force in atomic force microscopy
    Johansson, P
    Apell, P
    [J]. PHYSICAL REVIEW B, 1997, 56 (07): : 4159 - 4165
  • [8] Dynamic surface force measurement. I. van der Waals collisions
    Attard, P
    Schulz, JC
    Rutland, MW
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (11): : 3852 - 3866
  • [9] SCANNING FORCE TUNNELING MICROSCOPY OF A GRAPHITE SURFACE IN AIR
    SUGAWARA, Y
    ISHIZAKA, T
    MORITA, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1092 - 1095
  • [10] Torsional force microscopy of van der Waals moirés and atomic lattices
    Pendharkar, Mihir
    Tran, Steven J.
    Zaborski, Gregory, Jr.
    Finney, Joe
    Sharpe, Aaron L.
    Kamat, Rupini V.
    Kalantre, Sandesh S.
    Hocking, Marisa
    Bittner, Nathan J.
    Watanabe, Kenji
    Taniguchi, Takashi
    Pittenger, Bede
    Newcomb, Christina J.
    Kastner, Marc A.
    Mannix, Andrew J.
    Goldhaber-Gordon, David
    [J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2024, 121 (10)