Enhancement of lateral resolution in confocal self-interference microscopy

被引：12
|
作者：
Kang, DK [1 ]
Gweon, D [1 ]
机构：
[1] Korea Adv Inst Sci & Technol, Dept Mech Engn, Nano Optomechatron Lab, Taejon 305701, South Korea
来源：
OPTICS LETTERS | 2003年 / 28卷 / 24期
关键词：
D O I：
10.1364/OL.28.002470
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We describe confocal self-interference microscopy with enhanced lateral resolution. A uniaxial anisotropic crystal is used to cause interference between two linearly polarized beams that are reflected from the same pointlike object in the focal plane of the objective lens. Theory and the optimal design that maximizes the sensitivity of the interference signal are presented. A numerical experiment shows a 38% decrease in the lateral FWHM for simple confocal self-interference microscopy. (C) 2003 Optical Society of America.
引用
收藏
页码：2470 / 2472
页数：3
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