Surface conductivity of ultra-thin Na and Au films on Si(100)

被引：0

作者：

Ryzhkov, SV ^{[1
]}

Tsukanov, DA ^{[1
]}

Lifshits, VG ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Automat & Control Proc, Vladivostok 690041, Russia

来源：

PHYSICS OF LOW-DIMENSIONAL STRUCTURES | 1998年 / 7-8卷

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中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The surface conductivity of the samples with Au/Si(100) and Na/ Si(100) surface phases was measured in ultra-high vacuum by the four-point probe method at room temperature (RT). We have found that the difference in surface conductivity of impurity-adsorbed surfaces and clean Si(100)2 x 1 surface is (6.0 +/- 1.9) . 10(-5)Ohm(-1) . square for c(8 x 2)- Au, (11.1 +/- 0.8) . 10(-5)Ohm(-1) . square for root 26 x 3 - Au and -(1.5 +/- 0.8) . 10(-5)Ohm(-1) . square for the 3 x 2 - N a surface phase. These variations of surface conductivity are estimated to originate, in general, from the formation of the Me/Si(100) surface phase.

引用

页码：1 / 5

页数：5

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