Short-Term Memory Scanning Viewed as Exemplar-Based Categorization

Exemplar-similarity models such as the exemplar-based random walk (EBRW) model (Nosofsky & Palmeri, 1997b) were designed to provide a formal account of multidimensional classification choice probabilities and response times (RTs). At the same time, a recurring theme has been to use exemplar models to account for old-new item recognition and to explain relations between classification and recognition. However, a major gap in research is that the models have not been tested on their ability to provide a theoretical account of RTs and other aspects of performance in the classic Sternberg (1966) short-term memory-scanning paradigm, perhaps the most venerable of all recognition-RT tasks. The present research fills that gap by demonstrating that the EBRW model accounts in natural fashion for a wide variety of phenomena involving diverse forms of short-term memory scanning. The upshot is that similar cognitive operating principles may underlie the domains of multidimensional classification and short-term old new recognition.