Experimental search of parametric X-ray radiation in a silicon crystal at a small angle near the velocity direction of relativistic electrons

被引：22
|
作者：
Kalinin, BN [1 ]
Naumenko, GA [1 ]
Padalko, DV [1 ]
Potylitsyn, AP [1 ]
Vnukov, IE [1 ]
机构：
[1] Tomsk Polytech Univ, Inst Phys Nucl, Tomsk 634050, Russia
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2001年 / 173卷 / 1-2期
基金：
俄罗斯基础研究基金会;
关键词：
D O I：
10.1016/S0168-583X(00)00381-5
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
At the Tomsk synchrotron measurements of X-ray yield for the energies omega = 29-53 keV emitted in the forward direction from a perfect silicon crystal bombarded by 500-MeV relativistic electrons have been carried out. The contribution of parametric X-ray radiation (PXR) at a small angle near the velocity direction of electrons has not been observed. The possible maximum value of this radiation is smaller than 2% of the total intensity of bremsstrahlung and transition radiation. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：253 / 261
页数：9
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