Structure, microwave dielectric properties, and THz spectrum of Co0.5Sn0.5TaO4 ceramics

被引:4
|
作者
Yang, Hongyu [1 ]
Wu, Pei [2 ,3 ]
Xing, Mengjiang [2 ,3 ,4 ]
Li, Enzhu [2 ,3 ]
Chai, Liang [1 ]
机构
[1] Xidian Univ, Acad Adv Interdisciplinary Res, Xian 710071, Shanxi, Peoples R China
[2] Univ Elect Sci & Technol China, Natl Engn Res Ctr Electromagnet Radiat Control Ma, Chengdu 610054, Sichuan, Peoples R China
[3] Univ Elect Sci & Technol China, Minist Educ, Key Lab Multispectral Absorbing Mat & Struct, Chengdu 610054, Sichuan, Peoples R China
[4] Univ Elect Sci & Technol China, Yangtze Delta Reg Inst Huzhou, Huzhou 313001, Peoples R China
基金
中国国家自然科学基金;
关键词
Electroceramics; Crystal structure; Dielectrics; BOND THEORY; MG; CO;
D O I
10.1016/j.matlet.2021.130917
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Co0.5Sn0.5TaO4 ceramic was fabricated in this study, where the structural configuration and dielectric properties were discussed. A trirutile-type was confirmed via X-ray diffraction, Raman scatting spectroscopy, and TEM analysis. Temperature-stable Co0.5Sn0.5TaO4 ceramic with excellent microwave dielectric properties of an epsilon r value -18.6, a Q x f value about 36875 GHz (10.3 GHz) was achieved under TE011 mode; moreover, a tan delta value as low as -8 x 10-3 was also identified at 0.6 THz, showing prospects in high-frequency applications.
引用
收藏
页数:4
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