Morphological skeleton algorithm for PDP production line inspection

被引：0

作者：

Ge, RY ^{[1
]}

Clausi, DA ^{[1
]}

机构：

[1] Univ Waterloo, Waterloo, ON N2L 3G1, Canada

来源：

CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING 2001, VOLS I AND II, CONFERENCE PROCEEDINGS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Morphological skeletonization is an image processing technique that reduces complex, thick-lined images to a series of single pixel lines that accurately represent the original shapes. This procedure is especially useful to simplify automated applications requiring simple shape analysis and continuity checking by reducing the amount of redundant image data. In the semiconductor inspection field, skeletonization is a process that can be used to detect defects during plasma display panel (PDP) inspection. This paper will introduce a novel morphological skeletonization algorithm developed for electrode pattern inspection of PDPs. This algorithm has been successfully integrated within a commercial machine vision system.

引用

页码：1117 / 1122

页数：6

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