New techniques for the measurement of x-ray beam or x-ray optics quality

被引：1

作者：

Zeitoun, P ^{[1
]}

Balcou, P ^{[1
]}

Bucourt, S ^{[1
]}

Benredjem, D ^{[1
]}

Delmotte, F ^{[1
]}

Dovillaire, G ^{[1
]}

Douillet, D ^{[1
]}

Dunn, J ^{[1
]}

Faivre, G ^{[1
]}

Fajardo, M ^{[1
]}

Goldberg, KA ^{[1
]}

Idir, M ^{[1
]}

Hubert, S ^{[1
]}

Hunter, JR ^{[1
]}

Jacquemot, S ^{[1
]}

Kazamias, S ^{[1
]}

le Pape, S ^{[1
]}

Levecq, X ^{[1
]}

Lewis, CLS ^{[1
]}

Marmoret, R ^{[1
]}

Mercère, P ^{[1
]}

Morlens, AS ^{[1
]}

Naulleau, PP ^{[1
]}

Rémond, C ^{[1
]}

Rocca, JJ ^{[1
]}

Sebban, S ^{[1
]}

Smith, RF ^{[1
]}

Ravet, MF ^{[1
]}

Troussel, P ^{[1
]}

Valentin, C ^{[1
]}

Vanbostal, L ^{[1
]}

机构：

[1] Univ Paris 11, Lab Interact Rayonnement 10 Matiere, F-91405 Orsay, France

来源：

SOFT X-RAY LASERS AND APPLICATIONS V | 2003年 / 5197卷

关键词：

x-ray laser; longitudinal coherence; Michelson soft x-ray interferometry; EUV optics;

D O I：

10.1117/12.508183

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (deltalambda/lambdasimilar to10(-6)). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*10(14) Wcm(-2) by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as lambda/120 at 13 nm. Commercial developments are under way.

引用

页码：194 / 204

页数：11

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