BP neural network approach to module fault diagnosis for large analog circuit

被引：0

作者：

He, YG ^{[1
]}

Li, Y ^{[1
]}

Liu, MR ^{[1
]}

机构：

[1] Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Peoples R China

来源：

TENCON 2004 - 2004 IEEE REGION 10 CONFERENCE, VOLS A-D, PROCEEDINGS: ANALOG AND DIGITAL TECHNIQUES IN ELECTRICAL ENGINEERING | 2004年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

According to circuit decomposition technology and crossover tearing technology, a fast approach of module level fault diagnosis for large analog circuit based on BP (Back Propagation) neural network is presented The new approach is based on parallel diagnosis, so fault modules can be located quickly and effectively. The availability of the method is examined by simulation.

引用

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页码：D395 / D398

页数：4

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