Reliability of 4.6-μm quantum cascade lasers under continuous-wave room-temperature operation

被引:6
|
作者
Xie, Feng [1 ]
Caneau, Catherine G.
LeBlanc, Herve P.
Page, Christopher A.
Chaparala, Satish [2 ]
Deichmann, Oberon D.
Hughes, Lawrence C.
Zah, Chung-en
机构
[1] Corning Inc, Dept Semicond Technol Res, Corning, NY 14831 USA
[2] Corning Inc, Integrat Technol Dept, Corning, NY 14831 USA
关键词
quantum cascade lasers; reliability; midinfrared; indium phosphide; PERFORMANCE;
D O I
10.1117/1.3498776
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report the life test results for 9 4.6-mu m planar buried heterostructure quantum cascade lasers made of strain-balanced GaInAs/AlInAs/InP materials grown by metal organic vapor-phase epitaxy. No facet coating was deposited, and the devices were mounted on CuW submounts using AuSn solder. The aging condition is continuous wave operation at a heat-sink temperature of 22 degrees C with a constant current of 0.85A, corresponding to current densities of 4.7 and 2.7 kA/cm(2), for lasers with widths of 4 and 7 mu m, respectively. All lasers survived 5000 h aging, and most devices showed improved performance during the first 1000 h of aging. (C) 2010 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3498776]
引用
收藏
页数:5
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