Structure determination of submicron-sized porous materials by EM and XRD

被引：0
|
作者：
Sun, J. [1 ]
机构：
[1] Peking Univ, Coll Chem & Mol Engn, Beijing, Peoples R China
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2014年 / 70卷
关键词：
electron microscopy; X-ray diffraction; porous materials;
D O I：
10.1107/S205327331409069X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS60.O06
引用
收藏
页码：C930 / C930
页数：1
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