Analysis of high speed shear characteristics of Sn-Ag-Cu solder joints

被引:19
|
作者
Kumar, Santosh [1 ]
Park, Jae Yong [2 ]
Jung, Jae Pil [1 ]
机构
[1] Univ Seoul, Dept Mat Sci & Engn, Seoul 130743, South Korea
[2] PDF Solut, Richardson, TX 75082 USA
关键词
electronic materials; soldering; mechanical properties; scanning electron microscopy (SEM); high speed shear test; MECHANISM; RELIABILITY; FRACTURE;
D O I
10.1007/s13391-011-0160-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A high speed shear test for Sn-Ag-Cu(3.0 wt %Sn and 0.5 wt % Ag) solder has been studied by varying shearing rate, tip height and solder volume. Failure mode analysis of the solder joint revealed that ductile and brittle failure modes coexist when the shearingspeed is 500 mm/s or higher. The higher the shearing rate, the fewer the ductile failures and the more brittle or mixed failures have been observed. Tip height variation does not have astrong impact on failure mode, but occasions for pad lift appeared to be strongly related with tip height conditions. While the maximum shear force does not provide any indication of the failure mechanism, careful analysis of the force-displacement curves showed the potential of area related indices as a method to analyze the various failure modes.
引用
收藏
页码:365 / 373
页数:9
相关论文
共 50 条
  • [1] Analysis of high speed shear characteristics of Sn-Ag-Cu solder joints
    Santosh Kumar
    Jae Yong Park
    Jae Pil Jung
    Electronic Materials Letters, 2011, 7 : 365 - 373
  • [2] Size Effect on the Intermetallic Compound Coalescence in Sn-Ag-Cu Solder and Sn-Ag-Cu/Cu Solder Joints
    Zhou Min-Bo
    Ma Xiao
    Zhang Xin-Ping
    2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP), 2011, : 248 - 253
  • [3] Growth and shear strength of intermetallic compounds in Sn-Ag-Cu solder joints
    Zhu, Jiandong
    Wang, Chunqing
    Hang, Chunjin
    Tian, Yanhong
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 40 - 43
  • [4] Microstructural development of Sn-Ag-Cu solder joints
    Fix, AR
    López, GA
    Brauer, I
    Nüchter, W
    Mittemeijer, EJ
    JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (02) : 137 - 142
  • [5] Microstructural development of Sn-Ag-Cu solder joints
    Andreas R. Fix
    Gabriel A. López
    Ingo Brauer
    Wolfgang Nüchter
    Eric J. Mittemeijer
    Journal of Electronic Materials, 2005, 34 : 137 - 142
  • [6] Undercooling and Solidification Behavior of Sn-Ag-Cu Solder Balls and Sn-Ag-Cu/UBM Joints
    Xu, Guang-Sui
    Zeng, Jing-Bo
    Zhou, Min-Bo
    Zhang, Xin-Ping
    2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2013, : 325 - 329
  • [7] Microstructure and damage evolution in Sn-Ag-Cu solder joints
    Lehman, LP
    Kinyanjui, RK
    Wang, J
    Xing, Y
    Zavalij, L
    Borgesen, P
    Cotts, EJ
    55TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2005 PROCEEDINGS, 2005, : 674 - 681
  • [8] Sn-Ag-Cu Nanosolders: Solder Joints Integrity and Strength
    Ali Roshanghias
    Golta Khatibi
    Andriy Yakymovych
    Johannes Bernardi
    Herbert Ipser
    Journal of Electronic Materials, 2016, 45 : 4390 - 4399
  • [9] Microstructures Evolution and Properties of Sn-Ag-Cu Solder Joints
    Sun Lei
    Chen Minghe
    Zhang Liang
    Yang Fan
    ACTA METALLURGICA SINICA, 2017, 53 (05) : 615 - 621
  • [10] Sn-Ag-Cu Nanosolders: Solder Joints Integrity and Strength
    Roshanghias, Ali
    Khatibi, Golta
    Yakymovych, Andriy
    Bernardi, Johannes
    Ipser, Herbert
    JOURNAL OF ELECTRONIC MATERIALS, 2016, 45 (08) : 4390 - 4399