Analysis of Reflection and Scattering Characteristics at the 60GHz Frequency

被引:0
|
作者
Jung, Myoung-Won [1 ]
Kim, Jong Ho [1 ]
Yoon, Young Keun [1 ]
Chong, Young Jun [1 ]
机构
[1] ETRI, Technol Res Dept, Taejon 305700, South Korea
关键词
millimeter wave; scattering characteristic; reflection characteristic; surface roughness; ray-tracing;
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
This paper presents the analysis result of reflection and scattering characteristics for propagation prediction at the 60GHz frequency. Because the millimeter wave band has very short wavelength within a few millimeter, the scattering characteristic is occurred by the small roughness of the surface of a wall on indoor environment. In addition, because the propagation characteristics appear differently by the surface roughness of mediums, the propagation prediction is very difficult. Therefore, the scattering characteristics according to the surface roughness should be analysed for accurate propagation prediction. To predict the propagation characteristics in the indoor environments, we should have studied changes in the accordance with the rough surface. This paper analyses the reflection and scattering characteristics by the surface roughness of mediums in millimeter wave band, and studies the method for applying to the propagation prediction.
引用
收藏
页码:442 / 446
页数:5
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