Structural Features and Photoelectric Properties of Si-Doped GaAs under Gamma Irradiation

被引:5
|
作者
Shen, Ye [1 ]
Fang, Xuan [2 ]
Ding, Xiang [1 ]
Xiao, Haiyan [1 ]
Xiang, Xia [1 ]
Yang, Guixia [3 ]
Jiang, Ming [1 ]
Zu, Xiaotao [1 ]
Qiao, Liang [1 ]
机构
[1] Univ Elect Sci & Technol China, Sch Phys, Chengdu 610054, Peoples R China
[2] Changchun Univ Sci & Technol, Sch Sci, State Key Lab High Power Semicond Lasers, Changchun 130022, Peoples R China
[3] China Acad Engn Phys, Inst Nucl Phys & Chem, Mianyang 621900, Sichuan, Peoples R China
基金
中国博士后科学基金; 中国国家自然科学基金;
关键词
GaAs; gamma radiation; structural features; photoelectric property; RAMAN-SCATTERING; ION IRRADIATION; INDUCED DEFECTS; RADIATION; ELECTRON; ALXGA1-XAS; PARAMETERS;
D O I
10.3390/nano10020340
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
GaAs has been demonstrated to be a promising material for manufacturing semiconductor light-emitting devices and integrated circuits. It has been widely used in the field of aerospace, due to its high electron mobility and wide band gap. In this study, the structural and photoelectric characteristics of Si-doped GaAs under different gamma irradiation doses (0, 0.1, 1 and 10 KGy) are investigated. Surface morphology studies show roughen of the surface with irradiation. Appearance of transverse-optical (TO) phonon mode and blueshift of TO peak reflect the presence of internal strain with irradiation. The average strain has been measured to be 0.009 by Raman spectroscopy, indicating that the irradiated zone still has a good crystallinity even at a dose of 10 KGy. Photoluminescence intensity is increased by about 60% under 10 KGy gamma irradiation due to the strain suppression of nonradiative recombination centers. Furthermore, the current of Si-doped GaAs is reduced at 3V bias with the increasing gamma dose. This study demonstrates that the Si-doped GaAs has good radiation resistance under gamma irradiation, and appropriate level of gamma irradiation can be used to enhance the luminescence property of Si-doped GaAs.
引用
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页数:10
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