Metal and contaminant accumulation in ion beam induced film growth

被引:0
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作者
Carter, G [1 ]
Nobes, MJ [1 ]
McLaren, MG [1 ]
机构
[1] UNIV SALFORD,SCI RES INST,SALFORD M5 4WT,LANCS,ENGLAND
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:761 / 768
页数:8
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