Experimental Demonstration of 64-Port Thin-CLOS Architecture for All-to-All Optical Interconnects

被引：0

作者：

Xiao, Xian ^{[1
]}

Proietti, Roberto ^{[1
]}

Zhang, Kaiqi ^{[1
]}

Liu, Gengchen ^{[1
]}

Lu, Hongbo ^{[1
]}

Messig, Jeff ^{[2
]}

Yoo, S. J. B. ^{[1
]}

机构：

[1] Univ Calif Davis, Dept Elect & Comp Engn, One Shields Ave, Davis, CA 95616 USA

[2] Enablence USA Components Inc, 2933 Bayview Dr, Fremont, CA 94538 USA

来源：

2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2018年

基金：

美国国家科学基金会;

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We designed, assembled, and experimentally demonstrated a 64-port wavelength routing Thin-CLOS system in a 1U rack using four 32x32 AWGRs. BER measurements show error-free performance under the worst-case intra-band crosstalk scenario.

引用

页数：2

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