Pulsed laser deposition of epitaxial BaFeO3 thin films

被引：0
|
作者：
Darwish, Abdalla [1 ]
Wilson, Simeon [1 ]
Koplitz, Brent [2 ]
机构：
[1] Dillard Univ, Dept Phys, New Orleans, LA 70122 USA
[2] Dillard Univ, Dept Chem, New Orleans, LA 70122 USA
来源：
PHOTONIC FIBER AND CRYSTAL DEVICES: ADVANCES IN MATERIALS AND INNOVATIONS IN DEVICE APPLICATIONS V | 2011年 / 8120卷
关键词：
PLD; BaFeO3; Deposition rate; AFM; VSM; Barium ferrite; anisotropic constant K-1; coercive force (H-C); remnant magnetization (I-r); thin film photosensitivity; Ferromagnetic/paramagnetic resonance;
D O I：
10.1117/12.914083
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Epitaxial thin films of Barium Ferrite (BaFeO3) have been fabricated by the pulsed laser deposition technique on a Si substrate. The magnetic parameters were measured using vibrating sample magnetometer. The ferromagnetic resonance (FMR) measurements of the thin film were found to be close to the parameters associated with bulk materials. The Atomic Force Microscope was used to determine the surface morphology at different temperatures. The derivative FMR line width was measured to be 70 Oe at 60 GHz and 50 Oe at 90 GHz. The relationship among the Coercivity, crystalline orientation, and grain shape and size is presented.
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页数：10
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