High-Energy Diffraction-Enhanced X-ray Imaging

In order to apply the diffraction-enhanced X-ray imaging (DEI) method for much wider variety of samples, we have developed the high-energy DEI system. The energy of X-ray was increased up to 70 keV to achieve high permeability for heavy elements. The diffraction of Si(440) was used to keep large field of view. Demonstrative observation of an electrical cable was performed using the X-ray emitted from the vertical wiggler. The obtained images visualized not only the core and ground wire made of copper but also the isolator and outer jacket made of polymer clearly. The comparison of images obtained by the DEI and the absorption-contrast imaging showed that the sensitivity of DEI is about 10 times higher than that of the absorption method for light elements, and 3 times for heavy elements.