Research on Inversion Algorithm of Arbitrary Phase-shifting Wind Imaging Interferometer

被引:0
|
作者
Sun, Yongqiang [1 ,2 ,3 ]
Zhang, Chunmin [1 ,2 ,3 ]
Zhang, Pengju [1 ,2 ,3 ]
Han, Feng [1 ,2 ,3 ]
机构
[1] Xi An Jiao Tong Univ, Inst Space Opt, Xian 710049, Peoples R China
[2] Xi An Jiao Tong Univ, Sch Phys, MOE Key Lab Nonequilibrium Synth & Modulat Conden, Shaanxi Prov Key Lab Quantum Informat & Quantum O, Xian 710049, Peoples R China
[3] Acad Phys Sci & Technol, Res Ctr Space Opt & Astron, Inst Sci & Technol Opt & Particle Beams, Western China Sci & Technol Innovat Harbor, Xian, Peoples R China
基金
中国国家自然科学基金; 国家高技术研究发展计划(863计划);
关键词
Wind Imaging Interferometer; Advanced Iterative Algorithm (AIA); UPPER ATMOSPHERIC WIND; MICHELSON INTERFEROMETER; DYNAMICS;
D O I
10.1117/12.2586800
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The use of wind imaging interferometer to retrieve wind field information requires high accuracy of the instrument in phase shift. Traditional wind field inversion algorithms invert wind field information such as wind speed and temperature based on equal phase-shift interferometers. In actual situations, the phase shift of the wind imaging interferometer does not perfectly meet the design requirements, producing inversion result errors. In this paper, the inversion algorithm of an arbitrary phase shift wind imaging interferometer is studied, and the feasibility of the AIA (advanced iterative algorithm) inversion algorithm is verified under the condition of low accuracy of the instrument phase shift. The comparison of the inversion results of the AIA algorithm in wide-field interference and non-wide-field interference are respectively discussed. The influence of the unevenness of the strip system caused by the temperature distribution on the inversion accuracy of the AIA algorithm is analyzed. The conclusions of this paper can provide theoretical support for phase-shifting calibration of wind imaging interferometers and wind field information inversion in low-precision instruments.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Research on phase-shifting characteristic of retarder array in simultaneous phase-shifting interferometer
    School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing
    Jiangsu
    210094, China
    不详
    Jiangsu
    210042, China
    Guangxue Xuebao, 4
  • [2] Research on effects of phase error in phase-shifting interferometer
    Wang Hongjun
    Wang Zhao
    Zhao Hong
    Tian Ailing
    Liu Bingcai
    3RD INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PARTS 1-3, 2007, 6723
  • [3] Quadrature phase-shifting interferometer with a polarization imaging camera
    Tomohiro Kiire
    Toyohiko Yatagai
    Suezou Nakadate
    Masato Shibuya
    Optical Review, 2010, 17 : 210 - 213
  • [4] Quadrature phase-shifting interferometer with a polarization imaging camera
    Kiire, Tomohiro
    Yatagai, Toyohiko
    Nakadate, Suezou
    Shibuya, Masato
    OPTICAL REVIEW, 2010, 17 (03) : 210 - 213
  • [5] Phase-shifting shearing interferometer
    Griffin, DW
    OPTICS LETTERS, 2001, 26 (03) : 140 - 141
  • [6] Phase-shifting scatterplate interferometer
    North-Morris, M
    Wyant, JC
    ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY 2000, 2000, 4231 : 59 - 66
  • [7] Calibration for phase-shifting polarizer array in the simultaneous phase-shifting interferometer
    Yin, Jiayi
    Xu, Chen
    Su, Junhong
    Chen, Lei
    Zhongguo Jiguang/Chinese Journal of Lasers, 2009, 36 (SUPPL. 2): : 178 - 183
  • [8] Optimal phase-shifting algorithm for interferograms with arbitrary steps and phase noise
    Ayubi, Gaston A.
    Duarte, Ignacio
    Ferrari, Jose A.
    OPTICS AND LASERS IN ENGINEERING, 2019, 114 : 129 - 135
  • [9] Phase-shifting interferometer for surface inspection
    Tam, SC
    Low, BY
    Chua, HC
    Ho, ATS
    Neo, WP
    AUTOMATIC INSPECTION AND NOVEL INSTRUMENTATION, 1997, 3185 : 118 - 124
  • [10] Phase-shifting point diffraction interferometer
    Medecki, H
    Tejnil, E
    Goldberg, KA
    Bokor, J
    OPTICS LETTERS, 1996, 21 (19) : 1526 - 1528