EBSD analysis of the growth of (001) magnetite thin films on MgO substrates

被引：2
|
作者：
Koblischka-Veneva, A. [1 ]
Koblischka, M. R. [2 ]
Murphy, S. [3 ]
Arora, S. K. [3 ]
Hartmann, U. [2 ]
Muecklich, F. [1 ]
Shvets, I. V. [3 ]
机构：
[1] Univ Saarland, Inst Funct Mat, D-66041 Saarbrucken, Germany
[2] Univ Saarland, Inst Expt Phys, D-66041 Saarbrucken, Germany
[3] Trinity Coll Dublin, SFI Nanosci Lab, Dublin, Ireland
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2007年 / 144卷 / 1-3期
关键词：
magnetite; electron backscatter diffraction; texture; microstructure;
D O I：
10.1016/j.mseb.2007.07.054
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Magnetite (Fe3O4) thin films grown on (001) MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high-spatial resolution up to 20 nm even on ceramic samples. The magnetite films are fully strained due to the lattice mismatch of MgO and Fe3O4. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that most of the misorientation boundaries existing in the as-grown films are vanishing after the annealing step and the remaining misoriented grains form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of anti ferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：64 / 68
页数：5
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