High-Power-Density GaN-Based Converters Thermal Management Considerations

被引:14
|
作者
Jones, Edward A. [1 ]
de Rooij, Michael [2 ,3 ]
机构
[1] Infineon Technol, Neubiberg, Germany
[2] Efficient Power Convers Corp, Applicat Engn, El Segundo, CA USA
[3] Univ Johannesburg, Johannesburg, South Africa
来源
IEEE POWER ELECTRONICS MAGAZINE | 2019年 / 6卷 / 04期
关键词
Thermal resistance; Transistors; Electronic packaging thermal management; Resistance heating; Gallium nitride; Density management; Power system measurement; Integrated circuits; Thermal management;
D O I
10.1109/MPEL.2019.2946699
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Increasing the power density of the latest generation of gallium nitride (GaN) transistor-based power converters, where smaller die sizes and chip-scale packages are deployed, can be achieved by adding a simple thermal solution that yields systems that raise the bar and set the standard for power density. Heat extraction from a small GaN transistor, or integrated circuit, can be as effective as, if not superior to, removing the heat from a bulky Si MOSFET when employing a good thermal design. This article presents a simple-to-implement thermal solution suitable for chip-scale GaN transistors. Furthermore, the assembly criteria and design boundaries are given with a derivation of the thermal models together with experimental validation.
引用
收藏
页码:22 / 29
页数:8
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